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Tue Oct 10, 2017 9:30 am

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By-laws of FCAM

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After a long preparation time, the final rules of order for the "Frankfurt Center for Advanced Microscopy" (FCAM) was approved by the Presiding Committee at the Goethe Universität Frankfurt am...

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Nikon Demo Workshop October 2017

Features Eclipse Ti2-E: The Ti2's exceptionally stable, drift-free platform is designed to meet the demands of super-resolution imaging. The newest generation of the Perfect Focus System (PFS) automatically corrects focus drift caused by temperature changes and mechanical vibrations. The Auto Correction Collar enables users to easily achieve precise collar adjustment for maximal objective performance every time. Features confocal C2+: The C2+ is designed as an essential microscopy tool for the laboratory, providing powerful and robust confocal imaging capabilities. Focused on image quality and sensitivity, the C2+ uses a fully tunable emission GaAsP detector unit, capable of spectral imaging with user defined emission bandwidths. Features N-SIM E: The N-SIM E utilizes Nikon’s innovative approach to “structure d illumination microscopy” echnology. It doubles the resolution of conventional optical microscopes, providing 115 nm lateral and 270 nm axial resolution. N-SIM is a gentile and fast super-resolution method, all owing live cell imaging with a time resolution of approximately 1 sec/frame.

Speaker

Simone Lepper and Klaus Nettesheim (Nikon), PD Dr. Wabnitz (University of Heidelberg)
simone.lepper@nikon.com, klaus.nettesheim@nikcon.com

Date

Tue Oct 10, 2017 9:30 am

End date

Fri Oct 13, 2017 5:00 pm

Location

Goethe-Universität Frankfurt am Main, Frankfurt Center for Advanced Light Microscopy (FCAM) - Biozentrum, Max-von-Laue-Str. 9, Building N100, Seminar Room 114 + Room 2.11, 60438 Frankfurt am Main, Germany

Further information

Eclipse-Ti-E
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